TLC27L2 PDF

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Typically 0. Typically 95? Add R suffix to the device type e. Products conform to specifications per the terms of Texas Instruments standard warranty.

Production processing does not necessarily include testing of all parameters. The extremely high input impedance, low bias currents, and low power consumption make these cost-effective devices ideal for high gain, low frequency, low power applications.

These advantages, in combination with good common-mode rejection and supply voltage rejection, make these devices a good choice for new state-of-the-art designs as well as for upgrading existing designs. General applications such as transducer interfacing, analog calculations, amplifier blocks, active filters, and signal buffering are easily designed with the TLC27L2 and TLC27L7.

The devices also exhibit low voltage single-supply operation and ultra-low power consumption, making them ideally suited for remote and inaccessible battery-powered applications.

The common-mode input voltage range includes the negative rail. A wide range of packaging options is available, including small-outline and chip-carrier versions for high-density system applications. The device inputs and outputs are designed to withstand — mA surge currents without sustaining latch-up.

Supply voltage, VDD see Note 1. Unlimited Continuous total dissipation. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTES: 1. All voltage values, except differential voltages, are with respect to network ground. The output may be shorted to either supply. NOTES: 4. The typical values of input bias current and input offset current below 5 pA were determined mathematically.

This range also applies to each input individually. This inconvenience can be avoided by testing the device with split supplies and the output load tied to the negative rail. A comparison of single-supply versus split-supply test circuits is shown below. The use of either circuit gives the same result. VDD VO 20? Unity-Gain Amplifier 2 k? Noise-Test Circuit Figure 3. Gain-of Inverting Amplifier? The bias current at normal room ambient temperature is typically less than 1 pA, a value that is easily exceeded by leakages on the test socket.

Two suggestions are offered to avoid erroneous measurements: 1. Isolate the device from other potential leakage sources. Use a grounded shield around and between the device inputs see Figure 4. Leakages that would otherwise flow to the inputs are shunted away. Compensate for the leakage of the test socket by actually performing an input bias current test using a picoammeter with no device in the test socket. The actual input bias current can then be calculated by subtracting the open-socket leakage readings from the readings obtained with a device in the test socket.

One word of caution: many automatic testers as well as some bench-top operational amplifier testers use the servo-loop technique with a resistor in series with the device input to measure the input bias current the voltage drop across the series resistor is measured and the bias current is calculated. This method requires that a device be inserted into the test socket to obtain a correct reading; therefore, an open-socket reading is not feasible using this method.

Isolation Metal Around Device Inputs JG and P packages low-level output voltage To obtain low-supply-voltage operation, some compromise was necessary in the input stage.

This compromise results in the device low-level output being dependent on both the common-mode input voltage level as well as the differential input voltage level. When attempting to correlate low-level output readings with those quoted in the electrical specifications, these two conditions should be observed. If conditions other than these are to be used, please refer to Figures 14 through 19 in the Typical Characteristics of this data sheet. This parameter is actually a calculation using input offset voltage measurements obtained at two different temperatures.

When one or both of the temperatures is below freezing, moisture can collect on both the device and the test socket. This moisture results in leakage and contact resistance, which can cause erroneous input offset voltage readings. The isolation techniques previously mentioned have no effect on the leakage since the moisture also covers the isolation metal itself, thereby rendering it useless.

It is suggested that these measurements be performed at temperatures above freezing to minimize error. The full-linear response is generally measured by monitoring the distortion level of the output while increasing the frequency of a sinusoidal input signal until the maximum frequency is found above which the output contains significant distortion. The full-peak response is defined as the maximum output frequency, without regard to distortion, above which full peak-to-peak output swing cannot be maintained.

Because there is no industry-wide accepted value for significant distortion, the full-peak response is specified in this data sheet and is measured using the circuit of Figure 1. The initial setup involves the use of a sinusoidal input to determine the maximum peak-to-peak output of the device the amplitude of the sinusoidal wave is increased until clipping occurs.

The sinusoidal wave is then replaced with a square wave of the same amplitude. The frequency is then increased until the maximum peak-to-peak output can no longer be maintained Figure 5. A square wave is used to allow a more accurate determination of the point at which the maximum peak-to-peak output is reached. The problem becomes more pronounced with reduced supply levels and lower temperatures. Data at high and low temperatures are applicable only within the rated operating free-air temperature ranges of the various devices.

IIO 10 1 0. This design includes an input common-mode voltage range that encompasses ground as well as an output voltage range that pulls down to ground. The supply voltage range extends down to 3 V C-suffix types , thus allowing operation with supply levels commonly available for TTL and HCMOS; however, for maximum dynamic range, V single-supply operation is recommended.

Many single-supply applications require that a voltage be applied to one input to establish a reference level that is above ground. A resistive voltage divider is usually sufficient to establish this reference level see Figure The low input bias current of the TLC27L2 and TLC27L7 permits the use of very large resistive values to implement the voltage divider, thus minimizing power consumption.

The TLC27L2 and TLC27L7 work well in conjunction with digital logic; however, when powering both linear devices and digital logic from the same power supply, the following precautions are recommended: 1. Power the linear devices from separate bypassed supply lines see Figure 39 ; otherwise, the linear device supply rails can fluctuate due to voltage drops caused by high switching currents in the digital logic.

Use proper bypass techniques to reduce the probability of noise-induced errors. Single capacitive decoupling is often adequate; however, high-frequency applications may require RC decoupling. Figure Exceeding this specified range is a common problem, especially in single-supply operation.

The use of the polysilicon-gate process and the careful input circuit design gives the TLC27L2 and TLC27L7 very good input offset voltage drift characteristics relative to conventional metal-gate processes.

Offset voltage drift in CMOS devices is highly influenced by threshold voltage shifts caused by polarization of the phosphorus dopant implanted in the oxide. Placing the phosphorus dopant in a conductor such as a polysilicon gate alleviates the polarization problem, thus reducing threshold voltage shifts by more than an order of magnitude.

The offset voltage drift with time has been calculated to be typically 0. Because of the extremely high input impedance and resulting low bias current requirements, the TLC27L2 and TLC27L7 are well suited for low-level signal processing; however, leakage currents on printed circuit boards and sockets can easily exceed bias current requirements and cause a degradation in device performance. It is good practice to include guard rings around inputs similar to those of Figure 4 in the Parameter Measurement Information section.

These guards should be driven from a low-impedance source at the same voltage level as the common-mode input see Figure Unused amplifiers should be connected as grounded unity-gain followers to avoid possible oscillation. This feature makes the devices especially favorable over bipolar devices when using values of circuit impedance greater than 50 k? If the output is subjected to a short-circuit condition, this high current capability can cause device damage under certain conditions.

Output current capability increases with supply voltage. The devices drive higher capacitive loads; however, as output load capacitance increases, the resulting response pole occurs at lower frequencies, thereby causing ringing, peaking, or even oscillation see Figure In many cases, adding a small amount of resistance in series with the load capacitance alleviates the problem.

The simplest method involves the use of a pullup resistor RP connected from the output to the positive supply rail see Figure There are two disadvantages to the use of this circuit.

First, the NMOS pulldown transistor N4 see equivalent schematic must sink a comparatively large amount of current. In this circuit, N4 behaves like a linear resistor with an on-resistance between approximately 60? With very low values of RP, a voltage offset from 0 V at the output occurs.

Second, pullup resistor RP acts as a drain load to N4 and the gain of the operational amplifier is reduced at output voltage levels where N5 is not supplying the output current.

Compensation for Input Capacitance feedback Operational amplifier circuits nearly always employ feedback, and since feedback is the first prerequisite for oscillation, some caution is appropriate.

Most oscillation problems result from driving capacitive loads discussed previously and ignoring stray input capacitance. A small-value capacitor connected in parallel with the feedback resistor is an effective remedy see Figure The value of this capacitor is optimized empirically. Care should be exercised, however, when handling these devices, as exposure to ESD may result in the degradation of the device parametric performance.

The protection circuit also causes the input bias currents to be temperature dependent and have the characteristics of a reverse-biased diode. Internal protection diodes should not, by design, be forward biased. Applied input and output voltage should not exceed the supply voltage by more than mV. Care should be exercised when using capacitive coupling on pulse generators. Supply transients should be shunted by the use of decoupling capacitors 0.

F typical located across the supply rails as close to the device as possible. Once latch-up occurs, the current flow is limited only by the impedance of the power supply and the forward resistance of the parasitic thyristor and usually results in the destruction of the device. The chance of latch-up occurring increases with increasing temperature and supply voltages.

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Typically 0. Typically 95? Add R suffix to the device type e. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. The extremely high input impedance, low bias currents, and low power consumption make these cost-effective devices ideal for high gain, low frequency, low power applications. These advantages, in combination with good common-mode rejection and supply voltage rejection, make these devices a good choice for new state-of-the-art designs as well as for upgrading existing designs.

FT2955 DATASHEET PDF

TLC27L2 DOWNLOAD

Typically 0. Add R suffix to the device type e. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. These devices use Texas Instruments silicon-gate LinCMOS technology, which provides offset voltage stability far exceeding the stability available with conventional metal-gate processes. The extremely high input impedance, low bias currents, and low power consumption make these cost-effective devices ideal for high gain, low frequency, low power applications.

ANARQUISME I ALLIBERAMENT NACIONAL PDF

Original IC Chip Tlc27L2 Tlc27L2CDR Sop Precision Amplifier IC List

Typically 0. Typically 95? Add R suffix to the device type e. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. V Copyright?

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